Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe

ABSTRACT

Provided are a semiconductor probe having a resistive tip, a method of fabricating the semiconductor probe, and a method of recording and reproducing information using the semiconductor probe. The semiconductor probe includes a tip and a cantilever. The tip is doped with first impurities. The cantilever has an end portion on which the tip is positioned. The tip includes a resistive area, and first and second semiconductor electrode areas. The resistive area is positioned at the peak of the tip and lightly doped with second impurities that are different from the first impurities. The first and second semiconductor electrode areas are heavily doped with the second impurities and contact the resistive area.

BACKGROUND OF THE INVENTION

This application claims the benefit of Korean Patent Application No.2002-25400, filed on May 8, 2002, in the Korean Intellectual PropertyOffice, the disclosure of which is incorporated herein in its entiretyby reference.

1. Field of the Invention

The present invention relates to a high-speed, sensitive semiconductorprobe with a resistive tip and a method of fabricating the same, and toan information recording apparatus, an information reproducingapparatus, and an information measuring apparatus having thesemiconductor probe.

2. Description of the Related Art

As the demand for small-sized products such as portable communicationterminals and electronic notes increases, highly-integrated micrononvolatile recording media are increasingly required. It is not easy toreduce the size of existing hard disks and to highly integrate flashmemories. Thus, information storage media and method using a scanningprobe have been studied as a possible alternative.

The scanning probe is used in various types of scanning probemicroscopes (SPMs). For example, the scanning probe is used in ascanning tunneling microscope (STM), an atomic force microscope (AFM), amagnetic force microscope (MFM), a scanning near-field opticalmicroscope (SNOM), an electrostatic force microscope (EFM), and thelike. The STM detects a current flowing through a probe based on adifference between voltages applied to the probe and a sample toreproduce information. The AFM uses an atomic force between a probe anda sample. The MFM uses a magnetic force between a magnetic field nearthe surface of a sample and a magnetized probe. The SNOM improves aresolution less than the wavelength of visible light. The EFM uses anelectrostatic force between a sample and a probe.

In order to record and reproduce information at a high speed and densityusing such a SPM, a surface charge in a small area having a diameter ofseveral tens of nanometers should be detected. Also, a cantilever shouldbe made into an array form to increase a recording and reproductionspeed.

FIG. 1A is a perspective view of a metal-on-semiconductor field effecttransistor (MOSFET) probe of a scanning probe microscope, the MOSFETprobe having a MOSFET channel structure, disclosed in Korea PatentPublication No. 2001-45981, and FIG. 1B is an enlarged view of portion Aof FIG. 1A.

Referring to FIG. 1A, a MOSFET probe 22, which is formed by etching asemiconductor substrate 20, has a bar-shaped protrusion that protrudesfrom the semiconductor substrate 20. Electrode pads 20 a and 20 b faceeach other on a portion of the semiconductor substrate 20 contacting oneend of the MOSFET probe 22.

Referring to FIG. 1B, a source area 11 and a drain area 13 are formed onthe slope of a V-shaped tip 10 of the MOSFET probe 22, and a channelarea 12 is formed therebetween.

The V-shaped tip of the MOSFET probe 10 having the above-describedstructure is positioned on the end portion of a cantilever. Thus, it isnot easy to make probes having a radius of several tens of nanometersinto an array form. In the prior art, in order to manufacture such aprobe, a tip having a radius of several tens of nanometers should bemanufactured using the various processes including an oxidizationprocess and so forth so that the probe is perpendicular to a cantilever.However, since the precision of a photolithographic process decreasesconsiderably when a tip is formed to a height of several tens ofnanometers, it is difficult to form a source area and a drain area so asto make a short channel.

FIGS. 2A and 2B are schematic cross-sectional views for explaining amethod of reproducing information using a MOSFET tip in which source anddrain areas 11 and 13 are formed. Referring to FIG. 2A, a MOSFET tip 10,which is V-shaped, is doped with p-type impurities. Next, the MOSFET tip10 is doped with n-type impurities to form source and drain areas 11 and13 on the slope thereof. The MOSFET tip 10 detects a current flowingthrough a channel 12 based on the polarity of a surface charge 17 whileit moves over the surface of a recording medium 15, in order to detectthe polarity and density of the surface charge 17.

FIG. 2B is an enlarged cross-sectional view of the peak of the MOSFETtip 10 for explaining a process of expanding a depletion area 14.Referring to FIG. 2B, when the MOSFET tip 10 is positioned over apositive surface charge 17 in the recording medium 15, holes of thechannel 12 doped with p-type impurities move toward the source and drainareas 11 and 13 little by little due to electric fields induced by thepositive surface charge 17.

The depletion area 14, from which the holes are depleted due to themovement of the holes, expands. When an electric field greater than anelectric field maximizing the size of the depletion area 14 is appliedto the peak of the MOSFET tip 10, a channel containing minority carriersis formed at the peak of the MOSFET tip 10. If a greater electric fieldis applied to the peak of the MOSFET tip 10, a channel containingelectrons is connected to the source and drain areas 11 and 13. Then, acurrent flows through the channel due to a voltage applied between thesource and drain areas 11 and 13.

In other words, the MOSFET tip 10 operates as a transistor only if anelectric field induced by a surface charge has a value higher than athreshold electric field value that is suitable for expanding a channelcontaining minority carriers up to source and drain areas. Thus, since asurface charge inducing an electric field that is less than thethreshold electric field value cannot be detected, the MOSFET tip 10operates within a limited range and the sensitivity of the MOSFET probe10 degrades.

SUMMARY OF THE INVENTION

The present invention provides a semiconductor probe with a resistivetip that is sensitive to an electric field and a method of manufacturingthe same using a self-alignment method.

The present invention also provides an information recording,reproducing, and measuring apparatus for recording, reproducing, andmeasuring information on a recording medium by detecting an electricfield having a strength less than that of a minimum electric field thatcan be detected by using a MOSFET probe, and an information recording,reproducing, and measuring method therefor.

According to an aspect of the present invention, there is provided asemiconductor probe including a tip and a cantilever. The tip is dopedwith first impurities. The cantilever has an end portion on which thetip is positioned. The tip includes a resistive area and first andsecond semiconductor electrode areas. The resistive area is positionedat the peak of the tip and lightly doped with second impurities that aredifferent from the first impurities. The first and second semiconductorelectrode areas are heavily doped with the second impurities and contactthe resistive area.

According to another aspect of the present invention, there is provideda method of fabricating a semiconductor probe. A resistive area isformed on a substrate by lightly doping the surface of the substrate,which has been doped with first impurities, with second impurities thatare different from the first impurities. A mask layer having apredetermined shape is formed on the resistive area and areas of thesubstrate except the mask layer are heavily doped with the secondimpurities to form first and second semiconductor electrode areas. Aphotoresist having a predetermined shape is coated on the mask layer soas to be perpendicular to the mask layer and an etching process isformed to make the mask layer into a predetermined shape. The substrateis etched and a thermal oxidation process is performed to complete thesemiconductor tip.

It is preferable that the mask layer formed on the resistive area has astrip shape.

According to still another aspect of the present invention, there isprovided an information recording apparatus for recording information ona recording medium. The information recording apparatus includes anelectrode layer, a ferroelectric layer stacked on the electrode layer,and a semiconductor probe. The semiconductor probe includes a tip and acantilever, an end portion of which the tip is positioned on. The tipdoped with first impurities has a resistive area doped with secondimpurities and formed at the peak of the tip, and first and secondsemiconductor electrode areas doped with the second impurities andcontacting the resistive area, where the second impurities are differentfrom the first impurities. When a voltage is applied to the first andsecond semiconductor electrode areas, electric fields are formed betweenthe electrode layer of the recording medium and the tip, a dielectricpolarization is formed in the ferroelectric layer, and the semiconductorprobe records information on the recording medium.

According to yet another aspect of the present invention, there isprovided an information reproducing apparatus for reproducinginformation recorded on a recording medium. The information reproducingapparatus includes a ferroelectric layer and a semiconductor probehaving a tip and a cantilever, an end portion of which the tip ispositioned on. The tip doped with first impurities has a resistive areathat is doped with second impurities and formed at the peak of the tip,and first and second semiconductor electrode areas doped with the secondimpurities and contacting the resistive area, where the secondimpurities are different from the first impurities. The semiconductorprobe reproduces information recorded on the recording medium bydetecting a variation in the resistance of the resistive area due toelectric fields induced by the recording medium.

According to yet another aspect of the present invention, there isprovided an information measuring apparatus for imaging chargescontained in a sample including information emitting electric fields.The information measuring apparatus includes a semiconductor probehaving a tip and a cantilever, an end portion of which the tip ispositioned on. The tip doped with first impurities has a resistive areathat is doped with second impurities and formed at the peak of the tip,and first and second semiconductor electrode areas doped with the secondimpurities and contacting the resistive area, where the secondimpurities are different from the first impurities. The semiconductorprobe measures the information by detecting a variation in theresistance of the resistive area due to the electric fields induced bythe sample.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other features and advantages of the present inventionwill become more apparent by describing in detail exemplary embodimentsthereof with reference to the attached drawings in which:

FIG. 1A is a perspective view of a probe of a scanning probe microscopedisclosed in Korean Patent Publication No. 2001-45981;

FIG. 1B is an enlarged view of portion A of FIG. 1A;

FIG. 2A is a schematic cross-sectional view for explaining a method ofdetecting a surface charge of a recording medium, using a MOSFET tip;

FIG. 2B is a schematic cross-sectional view for explaining a principleof expanding a depletion area in the MOSFET tip;

FIG. 3 is a schematic cross-sectional view illustrating a semiconductorprobe according to an embodiment of the present invention;

FIG. 4 is a schematic cross-sectional view for explaining a principle ofexpanding a depletion area in the semiconductor probe according to thepresent invention;

FIGS. 5A through 5I are perspective views for explaining processes of amethod of manufacturing the semiconductor probe according to the presentinvention;

FIG. 6 is an enlarged view of portion B of FIG. 5I;

FIG. 7 is an exploded perspective view of an information recordingapparatus having the semiconductor probe according to the presentinvention;

FIGS. 8A and 8B are schematic cross-sectional views for explaining amethod of reproducing information using the semiconductor probeaccording to the present invention;

FIG. 9 is a schematic cross-sectional view for explaining a method ofrecording information using the semiconductor probe according to thepresent invention;

FIG. 10 is a photo of a scanning electron microscope (SEM) of aresistive tip of the semiconductor probe according to the presentinvention;

FIG. 11 illustrates a ferroelectric polarization of a lead zirconiumtitanate, Pb(Zr_(x)Ti_(1-x))O3 (PZT) layer detected by the semiconductorprobe according to the present invention; and

FIG. 12 illustrates a ferroelectric polarization of a triglycine sulfate(TGS) layer detected by the semiconductor probe according to the presentinvention.

DETAILED DESCRIPTION OF THE INVENTION

Hereinafter, a semiconductor probe and a method of fabricating the sameaccording to an embodiment of the present invention will be described indetail with reference to the attached drawings.

FIG. 3 is a schematic cross-sectional view illustrating a resistive tipof a semiconductor probe according to an embodiment of the presentinvention. Referring to FIG. 3, a resistive tip 50 includes a body 58doped with first impurities, a resistive area 56, which is positioned atthe peak of a resistive tip of the semiconductor probe 50 and lightlydoped with second impurities, and first and second semiconductorelectrode areas 52 and 54, which are formed on the slope around theresistive area 56 of the resistive tip 50 and are highly doped with thesecond impurities. Here, if the first impurities are p-type impurities,the second impurities are n-type impurities. If the first impurities aren-type impurities, the second impurities are p-type impurities.

In the semiconductor probe according to the embodiment of the presentinvention, a difference in a surface charge 57 in a recording medium 53causes electric fields of different strengths to be induced, due towhich a resistance of the resistive area 56 varies. The polarity anddensity of the surface charge 57 can be detected from the variation inthe resistance.

FIG. 4 is a schematic cross-sectional view for explaining a principle ofexpanding a depletion area in a resistive tip according to the presentinvention.

In the MOSFET tip 10 shown in FIG. 2B, the depletion area 14 expands upto the first and second semiconductor electrode areas 11 and 13 so thata channel containing minority carriers is formed at the peak of theMOSFET tip 10. As a result, a current flows between the source and drainareas 11 and 13, and the polarity of the surface charge 17 can bedetected from the strength of the current. However, in the resistive tip50 according to the present invention shown in FIG. 4, although adepletion area 68 does not expand up to the first and second electrodeareas 52 and 54, the resistance of a resistive area 56 varies. Thus, thepolarity and amount of a surface charge 57 can be detected from thevariation in resistance. Since the semiconductor probe according to thepresent invention includes the resistive tip 50 having a lower thresholdelectric field value than the MOSFET tip 10, the sensitivity of theresistive tip 50 is better than the MOSFET tip 10.

As can be seen in FIG. 4, the depletion area 68 formed in the resistivearea 56 expands toward the first and second semiconductor electrodeareas 52 and 54 due to electric fields induced by the surface charge 57.

Since the resistance R of the resistive area 56 satisfies equation 1,the resistance R is inversely proportional to the area [A] of theresistive area 56. Thus, the resistance R of the resistive area 56increases with an increase in the area of the depletion area 68. Varyingthe resistance R varies a current flowing through the resistive tip 50,and thus the surface charge 57 in the recording medium 53 can bedetected from variations in the current. $\begin{matrix}{R = {\rho\quad\frac{l}{A}}} & (1)\end{matrix}$wherein “ρ” denotes resistivity of the resistive area 56, “l” denotes agap between first and second semiconductor electrodes in meters, and “A”denotes the area of the resistive area 56 in square meters.

FIGS. 5A through 5I are cross-sectional views for explaining a method offabricating a semiconductor probe according to the present invention.Here, the method includes steps of forming a resistive area, formingsemiconductor electrode areas, forming a mask layer in a square shape,and forming a semiconductor probe.

In order to form a resistive area 31 a, as shown in FIG. 5A, the surfaceof a silicon or silicon-on-insulator (SOI) substrate 31, which has beendoped with first impurities, is lightly doped with second impurities.

In order to form first and second semiconductor electrode areas 32 and34, as shown in FIG. 5B, a mask layer 33 a is formed of silicon oxide orsilicon nitride on the resistive area 31 a of the silicon substrate 31.Next, the surface of the mask layer 33 a is coated with a photoresist 35b, and a mask 38 a having a strip shape is disposed on the photoresist35 b. Thereafter, the resultant structure is exposed, developed, andetched.

Accordingly, as shown in FIG. 5C, a mask layer 33 b having a strip shapeis formed on the silicon substrate 31. Next, all areas except the masklayer 33 b are heavily doped with second impurities during an ionimplantation process to form the first and second semiconductorelectrode areas 32 and 34.

During the ion implantation process, the first and second semiconductorelectrode areas 32 and 34 may be formed so that they have a much lowerresistivity than a resistive area 31 b.

In order to reduce the width of the resistive area 31 b between thefirst and second semiconductor electrode areas 32 and 34 to be less thanthe width of the mask layer 33 b, an additional annealing process isperformed after the ion implantation process so as to expand a heavilydoped region by diffusing ions therein.

In the method of fabricating the semiconductor probe according to thepresent invention, before fabricating a resistive tip 30, an ionimplantation process and a fine photolithographic etching process can beperformed to form the first and second semiconductor electrode areas 32and 34 and reduce the width of the resistive area 31 b.

As shown in FIGS. 5D and 5E, a photolithographic process and a dryetching process are performed to form a mask layer 33 c having a squareshape.

As shown in FIG. 5D, the photolithographic process is first performed.The surface of the silicon substrate 31 is coated with a photoresist 35c so as to cover the mask layer 33 c. Next, a photo mask 38 c having astrip shape is disposed on the photoresist 35 c so as to beperpendicular to the mask layer 33 c. Thereafter, the resultantstructure is exposed, developed, and etched to form a photoresist layer35 d having the same shape as the photo mask 38 c.

As shown in FIG. 5E, a portion of the mask layer 33 d not covered withthe photoresist layer 35 d is dry etched so that the mask layer 33 d ismade into a mask layer 33 e having a square shape as shown in FIG. 5F.

As shown in FIG. 5G, the silicon substrate 31 is wet or dry etched usinga mask layer 33 f having a square shape as a mask. Thereafter, as shownin FIG. 5H, the first and second semiconductor electrode areas 32 and 34are placed on the slope of the resistive tip 30, and then a resistivearea 31 g is aligned at the peak of the resistive tip 30.

FIG. 5I illustrates a semiconductor probe completed using theabove-described overall process. Referring to FIG. 5I, insulating layers37 are stacked on the silicon substrate 31. Electrodes 39 are formed onthe insulating layers 37. A cantilever 41 extends from the siliconsubstrate 31. The resistive tip 30 is perpendicularly formed on thecantilever 41. The first and second semiconductor electrode areas 32 and34 heavily doped with second impurities are positioned on the slop ofthe resistive tip 30. The resistive area 31 g lightly doped with secondimpurities is positioned at the peak of the resistive tip 30. The firstand second semiconductor electrode areas 32 and 34 are connected to theelectrodes 39 via the cantilever 41.

FIG. 6 is an enlarged view of portion B of FIG. 5I for illustrating theresistive tip 30 of the semiconductor probe according to the presentinvention. Referring to FIG. 6, the resistive area 31 g is positioned atthe peak of the resistive tip 30 that is conical. The first and secondsemiconductor electrode areas 32 and 34 are spaced apart from each otherand contact the resistive area 31 g. The first and second semiconductorelectrode areas 32 and 34 are disposed on right and left sides of theresistive tip 30 and extend the whole surface of the cantilever 41.

FIG. 7 is an exploded perspective view of an information recordingand/reproducing apparatus using the semiconductor probe shown in FIG. 5according to the present invention. Referring to FIG. 7, a stage 101 onwhich a recording medium 103 is placed is positioned at the bottom. Asemiconductor probe array 105 in which a plurality of semiconductorprobes 107 are aligned is disposed over the recording medium 103. Afirst signal processing module 113 and a second signal processing module111 are aligned on the semiconductor probe array 105. The first signalprocessing module 113 converts external information into a signal thatcan be recorded by the plurality of semiconductor probes 107 or convertsa signal reproduced by the plurality of semiconductor probes 107 intoinformation to be transmitted to the outside. The second signalprocessing module 111 transmits the signal converted by the first signalprocess module 113 to the semiconductor probe array 105 or transmits asignal generated by the semiconductor probe array 105 to the firstsignal processing module 113.

The stage 101 drives the recording medium 103 to move the recordingmedium 103 toward a desired probe among the plurality of semiconductorprobes 107.

An information measuring apparatus using the semiconductor probeaccording to the present invention may be constituted. The informationmeasuring apparatus includes a semiconductor probe. The semiconductorprobe includes a tip and a cantilever. The tip doped with firstimpurities has a resistive area that is doped with second impurities andformed at the peak of the tip, and first and second semiconductorelectrode areas, which are doped with the second impurities and contactthe resistive area where the second impurities are different from thefirst impurities. The tip is positioned at an end portion of thecantilever. The semiconductor probe measures information by detecting avariation in the resistance of the resistive area due to electric fieldsinduced by a sample. The principle of measuring information using theinformation measuring apparatus is similar to principle of reproducinginformation using the information recording and/or reproducing apparatusaccording to the present invention.

Hereinafter, a method of recording and reproducing information using theinformation recording and/or reproducing apparatus according to anembodiment of the present invention will be described in detail withreference to FIGS. 8A, 8B, and 9.

FIG. 8A illustrates a method of reproducing information by detecting apositive surface charge using a semiconductor probe in which a resistivearea is formed by doping p-type impurities therein. FIG. 8B illustratesa method of reproducing information by detecting a negative surfacecharge using a semiconductor probe in which a resistive area is formedby doping n-type impurities therein.

Referring to FIG. 8A, first and second semiconductor electrode areas 52and 54 are heavily doped with p-type impurities, and a resistive area 56is lightly doped with p-type impurities. A portion of a recording medium53 over which a resistive tip 50 is positioned has a positive surfacecharge 57. As a result, a depletion area (not shown) is formed in theresistive area 56 by electric fields induced by the positive surfacecharge 57.

As the depletion area is a nonconductive area, the area of the resistivearea 56 is reduced, which increases resistance. The resistive tip 50 candetect the positive surface charge 57 from a variation in theresistance. If the resistive tip 50 is positioned over a negativesurface charge, a depletion area is not formed. As a result, theresistance hardly varies or is reduced, and thus the polarity of asurface charge can be detected from the change in the resistance. Anegative charge may be defined as information “0”, and a positive chargemay be defined as information “1”. The opposite case is also possible.

Referring to FIG. 8B, first and second semiconductor electrode areas 52and 54 are heavily doped with n-type impurities, and a resistive area 56is lightly doped with n-type impurities. A portion of a recording medium53 over which a resistive tip 50 is positioned has a negative surfacecharge 57. A depletion area (not shown) is formed in the resistive area56 by electric fields induced by the negative surface charge 57. Aprinciple of detecting the negative surface charge from a variation inresistance due to a reduction in the area of the resistive area 56,using the resistive tip 50 according to the present invention, is thesame as that described with reference to FIG. 6A.

If the surface charge 57 is positive, a depletion area does not expand,and resistance hardly varies or is reduced. Thus, the polarity of thesurface charge 57 can be detected from the change in the resistance.

FIG. 9 is a cross-sectional view for illustrating a method of recordinginformation on a recording medium 53 using the semiconductor probeaccording to the present invention. Referring to FIG. 9, in order torecord information on the recording medium 53, the same voltage isapplied to first and second semiconductor electrode areas 52 and 54 andto a body 58 of a resistive tip 50. A bottom electrode 55, whichsupports the recording medium 53, is grounded. As a result, electricfields are formed between the peak of the resistive tip 50 and thebottom electrode 55 of the recording medium 53. Here, even if the samevoltage is applied only to the first and second semiconductor electrodeareas 52 and 54, electric fields are formed between the resistive tip 50and the bottom electrode 55, thereby allowing information to be recordedon the recording medium 53.

By the electric fields a dielectric polarization of a ferroelectriclayer in the recording medium 53 is created. Thus, a surface charge 57can be created or the polarity of an existing surface charge can bechanged. A negative charge may be defined as information “0”, and apositive charge may be defined as information “1”. The opposite case isalso possible.

FIG. 10 is a photo of an SEM of a resistive tip of the semiconductorprobe, according to the present invention, which is perpendicular to theend portion of a cantilever. Here, reference character C denotes aportion of the cantilever in which a resistive area 31 g is positioned,and reference numerals 32 and 34 denote first and second semiconductorelectrode areas, respectively.

FIG. 11 is an image illustrating ferroelectric polarization informationrecorded on a PZT layer using the semiconductor probe according to thepresent invention, as a variation in a resistance of the semiconductorprobe. FIG. 12 is an image illustrating a ferroelectric polarization ofa triglycine sulfate (TGS) layer. In an experiment carried out to obtainthe images, a recording voltage was set to 15V, a reproducing voltagewas set to 4V, and the scan rate was set to 2 Hz. In FIGS. 11 and 12, awhite portion represents the positive charges from domain polarized inbottom-to-top direction, and a black portion represents the negativecharges from domain polarized in top-to-bottom direction. An informationmeasuring apparatus using a semiconductor probe according to an aspectof the present invention detects and images electric fields induced bycharges contained in a sample by using the above-described principle.

As is known, the surface charge density of the ferroelectricpolarization of the TGS layer is generally about several μC/cm², and thesurface charge density of the ferroelectric polarization of the PZTlayer is about several tens of μC/cm².

By using a semiconductor probe according to the present invention,information having a small charge density of about several μC/cm² can berecorded or reproduced. Also, unlike an existing EFM, the semiconductorprobe according to the present invention does not use a signalmodulation technique. Thus, the semiconductor probe can detect a signalat a high speed.

A method of fabricating a semiconductor probe according to the presentinvention can form a resistive area in a resistive tip perpendicular tothe end portion of a cantilever using a self-alignment method of forminga resistive area in the center of a resistive tip that is positionedbetween semiconductor electrode areas. As a result, SPM-basednano-devices for detecting a small amount of surface charge in a smallarea of a recording medium can be easily fabricated.

When a nano-information recording, reproducing, or measuring apparatushaving a large capacity adopts the semiconductor probe that is suggestedin the present invention, the nano-information recording, reproducing,or measuring apparatus can detect a charge in a small area of arecording medium to record and reproduce information.

While the present invention has been particularly shown and describedwith reference to exemplary embodiments thereof, it will be understoodby those of ordinary skill in the art that an apparatus can record andreproduce information using various types of semiconductor probeswithout departing from the spirit and scope of the present invention asdefined by the following claims. Therefore, the scope of the presentinvention must be defined by the appended claims not by the aboveembodiments.

As described above, in a semiconductor probe and a method ofmanufacturing the same according to the present invention, a resistivearea can be formed in a resistive tip perpendicular to a cantilever todetect a small surface charge. The semiconductor probe has goodsensitivity and can be used in a nano-sensor or the like.

Also, since information can be detected from a variation in theresistance of the resistive area, information can be recorded andreproduced at a high density using a small driving voltage.

While the present invention has been particularly shown and describedwith reference to exemplary embodiments thereof, it will be understoodby those of ordinary skill in the art that various changes in form anddetails may be made therein without departing from the spirit and scopeof the present invention as defined by the following claims.

1. A semiconductor probe comprising: a tip doped with first impurities;and a cantilever having an end portion on which the tip is positioned,wherein the tip comprises: a resistive area positioned at the peak ofthe tip and lightly doped with second impurities that are different fromthe first impurities; and first and second semiconductor electrode areasheavily doped with the second impurities and contacting the resistivearea.
 2. A method of fabricating a semiconductor probe, the methodcomprising: forming a resistive layer on a substrate by lightly dopingthe surface of the substrate doped with first impurities, with secondimpurities that are different from the first impurities; forming a masklayer having a predetermined shape on the resistive layer and heavilydoping areas of the substrate except the region masked by the mask layerwith the second impurities to form first and second semiconductorelectrode areas; coating a photoresist having a predetermined shape onthe mask layer so as to be perpendicular to the mask layer andperforming an etching process to make the mask layer into apredetermined shape; and etching the areas of the substrate except theregion masked by the mask layer and performing a thermal oxidationprocess to form the tip of the semiconductor probe.
 3. The method ofclaim 2, wherein the mask layer formed on the resistive layer has astrip shape.
 4. An information recording apparatus for recordinginformation on a recording medium, the information recording mediumcomprising a bottom electrode, a ferroelectric layer stacked on thebottom electrode, and a semiconductor probe comprising: a tip that isdoped with first impurities in all part excluding a resistive area dopedwith second impurities at the peak of the tip and semiconductorelectrode areas doped with second impurities at the slope of the tip;and a cantilever having the tip positioned in an end portion of thecantilever, wherein information is recorded in the form of dielectricpolarization in the recording medium by applying a voltage between thesemiconductor electrodes and the bottom electrode thereby switchingdielectric polarization in the ferroelectric layer.
 5. An informationreproducing apparatus for reproducing information from a recordingmedium, the information reproducing apparatus comprising a ferroelectriclayer and a semiconductor probe comprising: a tip that is doped withfirst impurities in all part excluding a resistive area doped withsecond impurities at the peak of the tip and semiconductor electrodeareas doped with second impurities at the slope of the tip; and acantilever having the tip positioned in an end portion of thecantilever, wherein the semiconductor probe reproduces informationrecorded on the recording medium by detecting a variation in theresistance of the resistive area due to electric fields induced by therecording medium.
 6. An information measuring apparatus comprising asemiconductor probe comprising: a tip that is doped with firstimpurities in all part excluding a resistive area doped with secondimpurities at the peak of the tip and semiconductor electrode areasdoped with second impurities at the slope of the tip; and a cantileverhaving the tip positioned in an end portion of the cantilever, whereinthe semiconductor probe measures information by detecting a variation inthe resistance of the resistive area due to the electric fields inducedby the sample.